With the display industry moving conferences to virtual platforms due to Covid, it has been a busy few months for InZiv. CEO David Lewis was invited to speak about microLED inspection at three of the leading display conferences. In April, David spoke at the Micro-LED Industry Technology Summit (Shenzhen, China), while in June he spoke at the International Conference on Display Technology (Beijing, China).
In May, the Society for Information Display held its industry-leading Display Week. The conference attracts as many as 8000 attendees from dozens of countries across the globe. It is the premier event for all members of the display community and supply chain. David was invited to speak at the conference about InZiv’s work in microLED metrology. Among hundreds of presentations, his talk was highlighted in SID’s journal Information Display as the lead-off presentation in the session dedicated to the issue of microLED metrology. The talk was entitled: “Overcoming the Challenges in microLED Inspection and Manufacturing.” As the journal notes, the issue is “one of the toughest problems that the microLED display manufacturing industry is facing: testing, measurement, and quality control (QC). And while most people think of mass transfer as the key issue, we also need highly effective QC processes to enable high panel yields with no or minimal defects.”
David’s talk reviewed the many advantages of microLED and the concomitant manufacturing challenges that remain before they can be commercially viable and competitive. Fundamentally, the rapid pace of miniaturization that microLED pixels are undergoing demands the development of inspection tools that can achieve sub-micron resolutions. He explained how InZiv is developing new microLED inspection tools with the highest resolution in optical, spectral, and structural characterization. The presentation also included exciting never-before-seen data and images from collaborative work conducted with leading scientists from UCSB and Applied Materials.
InZiv is honored and excited to continue to be recognized as an emerging leader in microLED testing and inspection.
For more information on the conference and InZiv’s talk, see: https://onlinelibrary.wiley.com/doi/epdf/10.1002/msid.1200
