microLED/QLED Testing & Inspection
Highest Resolution
Because new display technologies demand new testing solutions...
Nanoscale measurements
With pixels currently being developed on a scale as small as single-microns, only the highest resolution techniques – down to the nanoscale – can meet today’s most rigorous characterization demands.
Detect and analyze defects
Identify irregularities and the most problematic sub-pixel features in defective, dim, and dead pixels.
Full wafer & highest resolution PL and EL
Inspect whole wafers with PL and AOI, and then individual pixels using nano-PL, electroluminescence (EL), and nano-EL.
Spectral, optical, and structural
Multiple inspection modalities in one system provides a comprehensive analysis of the pixel features – including the relationship between light, color, and structure.
Unprecedented PL and EL for optical, spectral, and structural data, including IV, LIV and EQE.
All at high-resolution. All correlated.
Industry Expertise
The Brightness Challenge in AR Displays – And Why microLED is the Solution
Augmented reality (AR) is quickly moving beyond niche use cases and becoming a more integrated part of our everyday lives. However, for AR to truly
Beyond Displays – The Surprising Role of microLEDs in Medicine and Biology
When people think of microLEDs, the first thing that likely comes to mind is high-end display technology—ultra-bright, energy-efficient screens with exceptional color accuracy. But what
Recent Conference Appearances
In just 2.5 years, InZiv has emerged as a world-recognized leader in microLED testing and inspection. CEO David Lewis has been invited to speak at numerous industry-leading display conferences. Please see below for recent conference appearances. Read more here
InZiv Named Top 5 microLED Start Up
InZiv has been selected as 1 of the “5 Top Micro-LED Startups Impacting The Electronics Industry” by StartUs Insights, an Austria-based research company that identifies emerging startups and technologies…
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Automated display testing and inspection
The OmniPix-ML1000(TM) – the first all-encompassing microLED testing system, offers both full wafer and localized individual pixel inspection. Combining highest resolution optical measurements (both PL and EL) with spectral and topographical data, the OmniPix-ML1000TM provides a state-of-the-art solution for microLED testing and inspection.
The OmniPix-OL1000(TM) integrates multiple inspection modalities in one system, and provides an unprecedented, comprehensive analysis of the pixel features. InZiv’s technology empowers OLED developers with the ability to better understand the relationship between light, color, and structure – directly addressing some of today’s most critical challenges in OLED.
Using proprietary and revolutionary nano-optical technology, InZiv provides unique tools for the inspection, identification, and characterization of the increasingly smaller pixels of MicroLED and QLED displays, thereby enabling display manufacturers and developers to achieve their technological potential and commercial objectives.
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