OmniPix 3.0
The OmniPix 3.0 offers the most comprehensive platform for automated microLED testing and characterization – with a complete set of optical, spectral, electrical, and structural measurements. The system serves as one comprehensive platform with all of the necessary measurements for microLED testing and characterization. Specially designed for both full wafer mapping and individual chip testing and characterization for even the smallest microLEDs.
All in 1 microLED Testing and Defect Review
Automated EL & PL in 1 Platform
Test your microLED wafers with automated EL and PL in 1 integrated platform. No need for multiple systems – InZiv’s OmniPix 3.0 offers both critical testing modes in 1 system.
EQE, IV, LIV, and more
microLED testing demands a full set of measurements for maximum quality assurance. Easily obtain the most critical electrical and optical data for your microLED testing protocols.
Angular Measurements
Understand the angular divergence of the light being emitted by the microLED, and the correlation of this emission with structural defects.
Highest Resolution
The OmniPix 3.0 is ideally suited for today’s smallest microLED devices - able to handle chips and pads as small as 1μm, with high-resolution testing down to 100nm.
Flexible Configuration
Multiple modalities in one system allow for both vertical top-emitting testing as well as bottom-optics for flip-chip structures.
Critical microLED testing and characterization data
- Current
- Voltage
- Centroid Wavelength
- Center Wavelength
- Peak Wavelength
- FWHM
- X,Y Chromaticity
- Dominant Wavelength
- Luminance
- EQE
- PMT Power
- Peak Power
Automated PL Mapping
Angular Measurements
Sidewall Measurements
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