OLED
Testing & Inspection

OmniPix-OL1000

Unprecedented optical, spectral, and structural OLED data.
All at high-resolution, all correlated. ​

Measure

optical, spectral, and topographical properties of OLED pixels and defects

Map

large scale panels for defective areas

Inspect

pixels features and a variety of defects

Characterize

defects at the submicron scale

Correlate

optical, spectral, and topographical properties of sub-pixel features

Maintain

sample integrity – non-destructive to display panels and pixels

Learn how InZiv can help your team with OLED testing and inspection.

Contact InZiv today

InZiv’s unique technology provides a comprehensive approach to the emerging challenges in OLED defect inspection. A rich set of data coupled with the highest resolution allows display developers and manufacturers to maximize efficiency and yield.

Advanced measurement capabilities – all correlated in one system.