Terrific piece in Display Daily outlining some of the key factors involved in EL testing and inspection for microLED wafers. InZiv is noted as a pioneer in this increasingly important field. Speed, non-damage, and resolution are among the major advantages of our R-EL high-throughput EL inspection system. You can read the full article here.
The Brightness Challenge in AR Displays – And Why microLED is the Solution
Augmented reality (AR) is quickly moving beyond niche use cases and becoming a more integrated part of our everyday lives. However, for AR to truly
