Terrific piece in Display Daily outlining some of the key factors involved in EL testing and inspection for microLED wafers. InZiv is noted as a pioneer in this increasingly important field. Speed, non-damage, and resolution are among the major advantages of our R-EL high-throughput EL inspection system. You can read the full article here.
CES 2025: Efforts to Lower Costs Propel microLED Innovation, as AR Continues to Advance
The Consumer Electronics Show (CES) 2025, held last week in Las Vegas, offered a glimpse into the future of microLED technology, highlighting incremental yet significant
