Products

Superior performance in both high-throughput microLED inspection and R&D microLED testing metrology

R-EL Glide

High Throughput EL microLED Wafer Inspection

High speed, high accuracy, non-damaging, full wafer EL inspection

OmniPix 3.0

All-in-one microLED Testing & Defect Review

Comprehensive turn-key solution for high-resolution microLED metrology

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Products

R-EL Glide

OmniPix 3.0

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