OmniPix 2.0
All-in-one microLED Testing & Defect Review
Comprehensive turn-key solution for high-resolution microLED metrology
Measure down to single µm microLED chips
Because your newest display technologies demand new testing solutions...
Automated PL & EL in 1 platform
Test your microLED wafers with automated PL and EL in 1 integrated platform. No need for multiple systems – InZiv’s OmniPix 2.0 offers both critical testing modes in 1 system.
EQE, IV, LIV
microLED testing demands a full set of measurements for maximum quality assurance. Easily obtain the most critical data for your microLED testing protocols.
Angular measurements
Understand the angular divergence of the light being emitted by the microLED, and the correlation of this emission with structural defects.
Sidewall measurements
Obtain measurements of even the most intricate locations, including emission from the sidewalls of the microLED.
Nano-PL and Nano-EL Down to 100nm optical resolution
With pixels currently being developed on a scale as small as single-microns, only the highest resolution techniques – down to the nanoscale – can meet today’s most rigorous characterization demands.
Spectral, optical, and structural data
Multiple inspection modalities in one system provides a comprehensive analysis of the pixel features – including the relationship between light, color, and structure.
Contact InZiv Today to Schedule a Demonstration on Your Sample
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Contact InZiv to schedule a demonstration on your microLED sample
Automated display testing and inspection
The OmniPix-ML1000(TM) – the first all-encompassing microLED testing system, offers both full wafer and localized individual pixel inspection. Combining highest resolution optical measurements (both PL and EL) with spectral and topographical data, the OmniPix-ML1000TM provides a state-of-the-art solution for microLED testing and inspection.
The OmniPix-OL1000(TM) integrates multiple inspection modalities in one system, and provides an unprecedented, comprehensive analysis of the pixel features. InZiv’s technology empowers OLED developers with the ability to better understand the relationship between light, color, and structure – directly addressing some of today’s most critical challenges in OLED.
