R-EL
高通量 EL microLED 晶圆检测​

高速、高精度、全晶圆 EL 检测

OmniPix 2.0
一体化 microLED 测试和缺陷审查

适用于高分辨率 microLED 计量的综合交钥匙解决方案

Wade Lee

Wade Lee

Greater China office

大中华区办公室

+886 958 740 629

InZiv采用专有技术,提供独特的工具,用以检测、识别和表征microLED、OLED和QLED所显示的越来越小的像素。从而,使显示器制造商和开发者能够实现其技术潜力和商业目标。

Do you have questions?

We would be happy to schedule a call to  discuss any of your questions and/or to plan a confidential demonstration for your unique microLED wafers. 
Read more about our Privacy Policy

This site is protected by reCAPTCHA and the Google Privacy Policy and Terms of Service apply.

Contact us today and learn how InZiv can help advance your OLED testing and inspection.

Contact us today and learn how InZiv can help advance your microLED testing and inspection.

This site is protected by reCAPTCHA and the Google Privacy Policy and Terms of Service apply.