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R-EL
高通量 EL microLED 晶圆检测​

高速、高精度、全晶圆 EL 检测

microLED characterization

OmniPix 3.0
一体化 microLED 测试和缺陷审查

适用于高分辨率 microLED 计量的综合交钥匙解决方案

Wade Lee

Wade Lee

Greater China office

大中华区办公室

+886 958 740 629

InZiv采用专有技术,提供独特的工具,用以检测、识别和表征microLED、OLED和QLED所显示的越来越小的像素。从而,使显示器制造商和开发者能够实现其技术潜力和商业目标。

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